ZEISS revolutionary Helium Ion Microscope Wins Two More Prestigious Awards

ORION™ Helium Ion Microscope wins awards from Semiconductor International and R&D Magazines

Carl Zeiss SMT yesterday was presented with a 2008 Editors’ Choice Best Product Award from Semiconductor International magazine in recognition of the revolutionary break-through performance of its ORION™ Helium Ion Microscope. The Best Product Awards are presented annually to acknowledge those products that deliver the level of excellence needed to succeed in today’s and tomorrow’s semiconductor industry. “We congratulate Carl Zeiss SMT for supporting the needs of the semiconductor industry with advanced microscopy technologies like the ORION™ Helium Ion Microscope,” said Laura Peters, editor-in-chief of Semiconductor International.

The Best Product Award was presented in San Francisco during the 2008 Semicon West exhibition where the latest technologies and products used by manufacturers of semiconductor and photovoltaic devices are introduced and demonstrated.

In addition, the ORION™ Helium Ion Microscope recently was named to receive an R&D 100 Award from R&D magazine. “The winning of an R&D 100 Award signifies that the product was judged to be one of the most technologically significant products introduced into the marketplace over the past year,” said Tim Studt, editor-in-chief of R&D magazine. “We congratulate Carl Zeiss SMT for maintaining its track record of being a powerful, continuing contributor of advanced technology to the world’s scientists and engineers.”

The R&D 100 Award is due to be presented at a formal awards banquet at Chicago’s Navy Pier in October.

“These awards mean a great honour to us,” said Dr. Dirk Stenkamp, Member of the Board of Carl Zeiss SMT AG. “They signal to us that we are on the right track, developing and refining technologies that become powerful, new products to help the world of science see, analyse and understand things as never before possible. It gives us great satisfaction that our work is valued and appreciated, but it also challenges us to keep moving forward, creating new tools to help conquer new frontiers in nanotechnology.”

The ORION™ Helium Ion Microscope had earlier won two awards:

* The Wall Street Journal, Technology Innovations Award in 2007
* The Carl Zeiss Innovation Award in early 2008.