LogicVision Announces Expanded Use of Embedded Test Solutions by NEC Electronics for SoC Designs
SAN JOSE, Calif. — October 23, 2006 — LogicVision, Inc. (NASDAQ: LGVN), a leading provider of semiconductor test and yield learning solutions, today announced that its embedded test solutions have been selected by NEC Electronics to help ensure impeccable quality and manufacturability, targeting SoC designs. LogicVision’s solutions for automotive microcontroller applications had been utilized by NEC Electronics in the past, and based on prior successes LogicVision solutions were selected for use across other projects.
“Our customers demand the lowest DPM (defects per million) levels possible to meet their overall quality needs,” said Shinichi Iwamoto, general manager, 1st Microcomputer Division, NEC Electronics. “LogicVision’s embedded test solutions have allowed us to meet our stringent quality requirements while at the same time reducing overall cost of test. Based on these results we’re now expanding the usage of LogicVision solutions to advanced SoC designs at smaller process geometries.”
Growing device complexity and shrinking process technologies have made cost-effective, high quality testing increasingly difficult for semiconductor manufacturers. Nanometer processes have created new challenges in detecting hard to model, or un-modeled defects. LogicVision achieves high quality test through application of a large number of at-speed pseudorandom test patterns, resulting in significantly greater defect coverage than alternative approaches. LogicVision test techniques provide excellent correlation with functional behavior, as pseudorandom-BIST timing closely mimics functional design stress conditions and detects performance defects that are only visible under functional conditions.
“Increasingly semiconductor and system companies are turning to LogicVision to meet their device test and quality requirements and reduce overall cost of test, as they design ever more complex devices in 90 and 65nm technology nodes,” said Jim Healy, president and CEO at LogicVision. ”We’re excited to be providing our unique logic and memory test solutions to NEC Electronics to help them achieve their uncompromising DPM requirements while lowering their cost of test.”
About LogicVision, Inc.
LogicVision, Inc. provides unique test and yield learning capabilities in the design for manufacturing space. These capabilities enable its customers, leading semiconductor companies, to more quickly and efficiently learn to improve product yields. The company’s advanced Design for Test (DFT) product line, ETCreate, works together with ETAccess Products Family and SiVision yield learning applications to improve profit margins by reducing device field returns, reducing test costs, and accelerating both time to market and time to yield. LogicVision solutions are used in the development of semiconductor ICs for products ranging from digital consumer goods to wireless communications devices and satellite systems. LogicVision was founded in 1992 and is headquartered in San Jose, Calif. For more information visit www.logicvision.com.
Forward Looking Statements
Except for the historical information contained herein, the matters set forth in this press release, including statements as to the expected features and benefits of our products, and the expected benefits of adopting our products to NEC, are forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995. These forward-looking statements are subject to risks and uncertainties that could cause actual results to differ materially, including, but not limited to, the impact of competing products and technologies, the risk that the expected benefits to NEC of adopting our products will not be realized, and other risks detailed in LogicVision’s Form 10-Q for the quarter ended June 30, 2006, and from time to time in LogicVision’s SEC reports. These forward-looking statements speak only as of the date hereof. LogicVision disclaims any obligation to update these forward-looking statements.
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