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Imagine Optic To Unveil The SL-Sys neo 76 At Photonics West – A Turnkey Solution For High-Resolution, Wavefront Characterization Of Miniature Optics


San Jose, CA and Orsay, France, January 26, 2009 – Imagine Optic, Europe’s leading manufacturer of Shack-Hartmann wavefront metrology and adaptive optics solutions is proud to announce that it will unveil the SL-Sys™ neo 76 at the annual SPIE event, Photonics West. The SL-Sys neo 76 follows on the heels of the “neo” 32 that was launched at the same event in 2008.

The SL-Sys neo 76 is designed for industrial R&D situations where the ability to perform total, high-resolution characterization of miniature optical components and assemblies is synonymous with maintaining a competitive-edge. In a single, fully automated and user parameterized procedure, the device enables users to retrieve an extraordinary amount of information about the characterized component. Measurement data includes wavefront aberrations, back focal length (BFL), effective focal length (EFL), chromatism, field curvature, distortion, vignetting, relative illumination as a function of the field, 3D MTF and the MTF through-focus for all measured points in the field, as well the best focal plane.

“We built the device following extensive market research into the needs of optical component manufacturers for high-performance characterization solutions that would help them cut R&D costs by streamlining the development of new products and decrease their time to market,” notes Xavier Levecq, Imagine Optic’s cofounder and Vice President of Marketing. “The SL-Sys family of products go beyond what simple pass/fail systems can do by providing detailed information on optical defects that enables users to not only identify that a problem exists, but to understand its origin.”

“The patented technology at the heart of the SL-Sys neo, notably its HASO™ wavefront sensor and its multi-axis rotation and translation stages, enables it to provide measurements that no other system on the market can,” adds Guillaume Dovillaire, Technical Director and COO at Imagine Optic. “Developing a product that can measure the entire field of view and the effective focal length (EFL) of any convergent optical component or assembly with pupil diameters ranging from 1-12 mm, without any limitation imposed by the component’s numerical aperture (NA), was a real challenge that all of us at Imagine Optic took on with great enthusiasm.”

Imagine Optic will be providing demonstrations of the SL-Sys neo 76 at Photonics West on stand 527.

Members of the press are invited to contact Mark Zacharria at Elucido Partners by mail at or by telephone on +33 (0)1 46 28 03 13. For more product information, please visit or call +33 (0)1 86 64 15 60.

More about Imagine Optic

Imagine Optic is Europe’s foremost provider of high-precision Shack-Hartmann wavefront sensors and adaptive optics products. The Company was founded in Orsay France in 1996 to respond to the growing need for reliable wavefront metrology, analysis and correction technologies for applications at the forefront of science and industry. Imagine Optic has maintained its position as an industry leading innovator by introducing several breakthrough products including the world’s first X-EUV wavefront sensor in 2005 and, in 2008 with its sister company Imagine Eyes, the mirao™ 52-e Electromagnetic Deformable Mirror. Over the past two years, the Company has completely renewed its product line to respond to customer needs. Imagine Optic currently employs over 20 qualified professionals in a variety of fields and is represented internationally by its extensive distributor network.


 optics characterization
 wavefront sensor
 miniature optics
 precision metrology
 optics testing

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