Agilent Technologies, Hynix Create Long-Wire ZIF Probe Tips for DDR, GDDR Memory Validation

Agilent Technologies Inc. (NYSE: A) announced today that it collaborated with Hynix Semiconductor Inc., a worldwide supplier of advanced semiconductor memory products, to produce a high-bandwidth, high-performance long-wire ZIF (zero insertion force) probe tip optimized for DDR (double data rate ) and GDDR (graphics double data rate) SDRAM validation. The long-wire ZIF tip allows engineers to make accurate measurements of high-speed signals when they probe signals located farther apart. These tips are used with Agilent’s award-winning InfiniiMax and ZIF probing system, which offers improved usability and lower cost per solder attachment.

This probing option addresses one of the basic challenges of DDR design: It allows engineers to probe hard-to-reach locations on a DRAM chip while maintaining signal integrity. As the speed of DDR and GDDR SDRAM devices increases, and the design margins become smaller, the performance of the probing system becomes ever more critical. The long-wire ZIF tip addresses this probing challenge.

Another challenge with DDR and GDDR validation is the number of signals that need to be tested for JEDEC specifications. The design of the long-wire ZIP tip allows engineers to easily switch between the multiple signals they need to probe on a SDRAM device.

This product fulfills the complete compliance testing requirements for DDR memory designs.

“We liked the performance of Agilent’s original ZIF tip accessories, but we wanted the tips to be longer and more flexible so we can access signals that are farther apart,” said Kun-Sang Yoon, vice president of Hynix’s Graphics Memory Application Team. “Agilent took our feedback and quickly came back with the probing solution that meets our needs. The long-wire ZIF tip accessories maintain high signal-integrity performance, allowing us to accurately measure our high-speed signals.”

“We keep a strong pulse on the needs of our customers,” said Scott Sampl, vice president and general manager of Agilent’s oscilloscope product line. “Our experts work closely with industry leaders like Hynix and with the standards bodies. These relationships give us the ability to quickly respond to changes that will improve measurement efficiency and accuracy. We have the right tools -- from BGA probing technology to compliance software applications -- to help engineers validate their DDR and GDDR memory designs quickly.”

Additional information about Agilent’s N5451A InfiniiMax differential long-wire ZIF Tips is available at www.agilent.com/find/n5451a.

Agilent’s complete portfolio of oscilloscopes is available in a variety of form factors, from 20 MHz to 90 GHz, offering industry-leading specifications and powerful applications.