Agilent Technologies Introduces High-Resolution Large Stage Atomic Force Microscope
Agilent Technologies Inc. (NYSE: A) today announced the availability of the Agilent 5600LS, a high-resolution atomic force microscope that uses a fully addressable 200mm x 200mm stage to image large samples in air or smaller samples in liquid. The 5600LS also enables high-resolution imaging of a small sample area using an AFM or STM scanner. Its new, low-noise AFM design (.05nm) guarantees single atomic steps.
“We have engineered the 5600LS to provide university and industry researchers maximum imaging versatility,” said Jeff Jones, operations manager for Agilent’s AFM facility in Chandler, Ariz. “This high-precision scientific instrument is ideal for a wide range of nanotechnology applications, including semiconductor, data storage, polymers, materials science and life science studies.”
Samples up to 8 inches in diameter and 30mm tall are easily accepted by the 5600LS AFM’s 200mm vacuum chuck; the programmable stage can accommodate a 300mm wafer with repositioning. Accurate location mapping (400nm precision) ensures reproducibility. The 5600LS also allows simple, software-driven, point-and-shoot AFM imaging of an area of interest based on an optical view. Motorized optical zoom and focus provide excellent ease-of-use.
Any of Agilent’s multipurpose scanners, including open-loop, closed-loop and STM options, can be used with the 5600LS. Open-loop and closed-loop Agilent multipurpose scanners are available in two scan ranges: 90�m x 90�m, or 9�m x 9�m. Interchangeable scanner nose cones let users switch imaging modes quickly and conveniently.
The Agilent 5600LS is compatible with contact mode, acoustic AC mode, phase imaging, STM, LFM, EFM, MFM, force modulation, current sensing and MAC Mode III. Agilent’s patented MAC Mode III provides three user-configurable lock-in amplifiers, affording researchers virtually limitless application possibilities and unprecedented speed. It allows single-pass imaging concurrent with KFM/EFM, facilitates vertical or lateral modulation studies, and supports the use of higher resonance modes of the cantilever.
Join Agilent for an e-Seminar ’Scanning Microwave Microscopy - Electromagnetic Materials Measurements at High Spatial Resolution’ on August 7 at 9 a.m. PT. To register visit https://agilenteseminar.webex.com/agilenteseminar/onstage/g.php?t=a&d=664462002.
AFM Instrumentation from Agilent Technologies
Agilent Technologies offers high-precision, modular AFM solutions for research, industry and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent’s leading-edge R&D laboratories ensure the continued, timely introduction and optimization of innovative, easy-to-use AFM technologies.
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