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National Instruments Hosts the Online Automated Test Summit 2008


Virtual Event Brings Industry-Leading Companies Together to Share Cost Reducing Strategies

NEWS RELEASE – April 2008 – National Instruments today announced the fifth annual Automated Test Summit, an online event featuring technical sessions focused on identifying trends and overcoming challenges in automated test. The Automated Test Summit 2008 will be hosted live on the Internet on June 5 and will be presented in the Americas, Europe and Asia, giving attendees the opportunity to speak with experts in various languages. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibition area.

“The NI Automated Test Summit brings together a real-time global audience that covers every conceivable industry associated with electronics test,” said Jean-Yves Allard, vice president of research and development for Averna. “As an exhibitor, we interact live with booth visitors from four continents at the same time. The balance of technical presentations coupled with the latest offerings from the exhibitors provides a valuable forum for all participants – and they don’t even have to leave their desks.”

Representatives from leading test and measurement companies worldwide such as Averna, Cal-Bay, Intel, Microsoft and Tektronix will share their technical expertise and best practices in sessions during the event. NI Business and Technology Fellow Mike Santori will present the keynote “Optimizing Efficiency in Test.” Session themes include:

· Reducing software development cost
· The latest trends in hardware design
· Extending the life of your test system
· Test engineering panel discussion

Participants can register online and find a full list of technical sessions at


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