Tektronix Introduces Most Comprehensive Test Set for Next Generation DDR3 Memory

Comprehensive Test from Analog to Digital Validation for All DDR Versions; New TLA7BB4 Module Provides the Only Logic Analysis Solution to Address All DDR Speeds

BEAVERTON , Ore. , March 2008 - Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, announced a comprehensive test toolset for DDR 2 and new DDR 3 technology www.tek.com/memory. DDR 3 is the next generation of Double Data Rate (DDR ) Synchronous Dynamic Random Access Memory (SDRAM) that will deliver higher performance data rates. The Tektronix DDRtest solution supports all speeds of DDR , DDR 2 and DDR 3, spans both analog and digital domains, and is based upon industry-leading hardware and software. Tektronix offers the engineering customer a complete DDR 3 test bench.

TheDDR 3 standard supports data rates of 800 mega transfers per second (MT/s) to 1600 MT/s with clock frequencies of 400 MHz to 800 MHz respectively, double the speed of DDR 2 technology. DDR 3 should be ideal for high-performance applications such as file servers, video on demand, encoding and decoding, gaming, and 3-D visualization.

For digital validation and debug, the TLA7000 logic analyzer and the new TLA7BB4 acquisition module provide the only logic analysis solution available to address all speeds of DDR , DDR 2 and DDR 3, including DDR 3-1600. Furthermore, this new DDRtest set provides a cost savings up to 30% over existing approaches. The TLA7BB4 with Nexus Technology DDR 3/DDR 2 Protocol Violation Software automates the analysis of aDDR 2 or DDR 3 bus to quickly and easily identify protocol violations, frequency of those violations, and also provide a global view of all the DDRcommands in the logic analyzer memory. With memory support and probing solutions, the TLA7000 series provides the most capable solution for digital validation and debug. Physical link analysis is performed using a DSA8200 sampling oscilloscope for TDR -based signal path characterization and circuit board verification.

For analog validation and debug, the new DDRAnalysis option (opt. DDRA) on the DSA70000 family of Digital Serial Analyzers along with matching P7500 TriMode™ active differential probes and DPOJET measurement software, provide a powerful debug toolset that automatically identifies reads and writes, and performs Clock, Jitter, Amplitude, Timing, and Eye Diagram measurements. NewDDRprobe tips for the P7500 Series are able to attach to hard to reach portions of the device under test.

“Leading edge designs, short product lifecycles, increasing design complexity, and measurement conformance for specific technologies and data rates necessitates superior validation and test tools, ” said Chris Martinez, director of strategic marketing, Tektronix. “With leading oscilloscopes, logic analyzers, probes and supporting software, engineers have access to an entirely new portfolio with the industry-best capabilities needed to develop next generation products incorporating DDR technology. The portfolio of high-speed test products from Tektronix provides engineers with the latest and most advanced tools available and forms the core of a critical test bench for design and test engineers working with DDR .”

Pricing and Availability

Components of the DDRtest suite are available for purchase and delivery from Tektronix. Additional elements for logic analyzer memory support including DDR 3/DDR 2 Protocol Violation Software are available for purchase from Nexus Technology www.NexusTechnology.com.