LitePoint Multiport Test Adapter for Complete, Low-cost MIMO Testing on Current One-Box Testers
LitePoint Corporation, an industry leading provider of advanced wireless test solutions, today announced the availability of the LitePoint Multiport Test Adapter (MPTA) for low-cost R&D and manufacturing test of 802.11n MIMO devices. The Multiport Test Adapter now enables both industry standard composite EVM along with fast-switching test methodologies allowing multi-channel MIMO devices to be accurately and comprehensively tested on existing, low-cost one-box test instruments from LitePoint. Supported by the LitePoint IQfact family of automated test programs, the MPTA allows OEMs/ODMs to further minimize MIMO manufacturing implementation and test times for faster time to revenue.
“Multiple VSG and VSA test systems like the LitePoint IQnxnâ are ideally suited for R&D and QA organizations to fully test MIMO products, but this methodology is typically too expensive for manufacturing test. However, with the Multiport Test Adapter running on simple, yet robust one-box testers, OEMs and ODMS can achieve accurate and reliable results but at the low-cost test targets demanded by manufacturing. The MPTA helps our world-class customers satisfy their quality and cost MIMO test demands,” said Sireesha Mallipeddi, director product management at LitePoint Corporation. “This once again demonstrates the flexibility and power of the one-box test solutions from LitePoint and shows our continued commitment to our customers to provide comprehensive and cost-effective test programs delivering the highest yields and quality.”
The Multiport Test Adapter’s wide operating range (2 GHz to 6 GHz) addresses both 802.11n WiFi products as well as the anticipated 802.16e Wave 2 WiMAX products. It features direct RF connections to the DUT and single USB 2.0 interface for control and power from the test instrument. The composite and fast-switch features offer the flexibility to implement complete and accurate manufacturing test solutions plus a common platform to deal with low-cost R&D, design verification, and QA needs. The closely coupled architecture provides fast test execution yielding lower test costs while optimizing critical MIMO testing challenges such as full Tx and Rx manufacturing test in MIMO mode, Tx and Rx isolation test, Rx sensitivity test, and highly accurate EVM.
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