New TEM Enables View of Sub-atomic Details
Unique, high-performance electron microscope from Carl Zeiss SMT successfully installed at the caesar institute in Bonn, Germany
A unique transmission electron microscope (TEM) for the imaging and analysis of materials with atomic resolution has now been successfully installed at the caesar Institute in Bonn. The CRISP (= Corrected Illumination Scanning TEM Probe) system from the Nano Technology Systems Division of Carl Zeiss SMT utilizes a variety of uniquely combined electron-optical innovations. These include, above all, an imaging energy filter from the ZEISS 200kV LIBRA™ 200 instrument generation, supplemented with an electrostatic electron monochromator and an aberration-corrected illumination system. These technological innovations provide the research scientists at caesar with unparalleled insights into the innermost properties of materials.
Dr. Stephan Irsen, responsible for electron microscopy at the caesar Institute, was highly satisfied at the successful acceptance of the CRISP microscope: “The instrument features outstanding imaging and spectroscopic possibilities and provides our researchers and partners with images of atomic structures during scanning operation and a spectroscopic characterization of the atomic specimen structures at the highest level"
Dr. Dirk Stenkamp, Member of the Board at Carl Zeiss SMT and Vice President & General Manager of the Nano Technology Systems Division, is convinced that CRISP marks the successful beginning of a series of upcoming installations of high-performance electron microscopes from ZEISS: “In recent years, we have invested heavily in the enhancement of our TEM systems and, in cooperation with our demanding key customers, taken their development to the limits of what is technologically feasible. Additionally, we have achieved a level of user-friendliness, specimen throughput and system stability that sets the standard even when compared with international competitors.”
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