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EMSL Now Offering Electron Microscopy Videos to Aid Manufacturers in Quality Control

Materials Testing Laboratory Expands Services


Cinnaminson, NJ

EMSL has just outfitted their Scanning Electron Microscope (SEM) with Video recording capabilities.  Digital Video recording of electron microscopy analysis is useful for microelectronics, biomedical device manufacturing, pharmaceutical, aerospace, precision engineering and television & advertising companies that use videos for Business-to-Business promotions of small products.
EMSL SEM videos provide a continuously moving, “live-time”, tilting & rotating microscopic view compared to just one single SEM still image.  Any SEM Video can be deconstructed to also provide literally thousands of SEM still images that can be viewed one frame at a time to see the object of interest in any angle or position. SEM Videos provide a brand new problem solving tool for Production & Quality Control issues.
From crystalline defect analysis to thin film analysis, contaminant identification to microelectronic patterning and defect characterization, more and more companies turn to EMSL and their expert staff for subcontracting their analytical services.
“EMSL solves complex problems through laboratory testing by providing services not readily available at many commercial testing laboratories”, states Joe Frasca, Senior Vice President of Marketing at EMSL Analytical, Inc.  “We solve problems encountered by many through analytical testing on a daily basis”, he continued.
About EMSL Analytical, Inc.
EMSL Analytical, Inc. provides high Scanning Electron Microscopy, Transmission Electron Microscopy, Energy Dispersive X-Ray Elemental Analysis, Light Microscopy and Fourier Transform Infra Red for the purpose of contamination analysis, failure analysis, materials analysis, and surface properties testing.  For more information, visit EMSL at or contact them at 1-800-220-3675 east coast, 1-866-798-1089 west coast.


 Electron Microscopy video
 manufacturers quality
 SEM video crystalline
 production quality film
 defect characterization

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