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Advantest Announces NAND Flash Test Solutions


Total Device Test Support from Wafer Test to Volume Production

TOKYO, Japan, - Advantest Corporation (TSE: 6857, NYSE: ATE) today announced the availability of two new solutions for next-generation NAND flash memory test: the T5773 for package test and the HA5100CELL, based on the Harmonic architecture, for wafer test. Together, the tools offer total test support for high-capacity, high-speed next-generation NAND flash memory devices, from the front end to the back end.

With the increasing popularity of smartphones, multifunctional portable devices, and SSDs, demand for NAND flash memory has skyrocketed: the global NAND market is set to grow 18% in 2011, according to market research firm IHS iSuppli. Moreover, NAND flash device capacity and speed is also increasing. Average data transmission speeds have climbed ten-fold to 400Mbps. These technological innovations, together with the proliferation of end-product markets, are driving explosive bit growth and production volume increases, and reinforcing a trend towards longer device test times. With device speeds expected to increase further, NAND manufacturers require a test system that lowers test costs while offering an operating frequency range that can support ONFI3 interfaces. Advantestís next-generation NAND flash memory test solutions meet these needs with groundbreaking technology that delivers unprecedented test time and test cost reductions.

*Front-End NAND Flash Test Solution with Industry-Best Parallel Test Capacity: the HA5100CELL

-The Harmonic Architecture (HA) platform is another industry first from Advantest: an all-in-one wafer test solution that combines a tester and prober in a single tool, and four test cells into one. With the capability to test four wafers at once, the HA5100CELL is a dedicated NAND flash memory tester which offers a reduced footprint 1/4 the size of previous systems. Itís operating frequency of 100MHz and a maximum parallel test capacity of 6,144 DUTs. This innovation deliver 50% test cost savings over previous test cells. The HA5100CELL utilizes a Advantest-developed contact compliance technology that enables a one-touch high-volume solution. The HA5100ES, an engineering system for R&D device evaluation, is also available.

*Back-End NAND Flash Test Solution Offering Industryís Lowest Test Cost: the T5773

-Advantestís T5773 is a package test system for NAND flash memory that supports high-speed interfaces for SSDs, handsets and other applications, meeting the test needs of device types that demand as much as 4X the test speed of previous types. The T5773ís operating frequency range is 200MHz / 400Mbps and offers a typical parallel test capacity of 768 DUTs. Additionally, the T5773ís innovative design achieves significant power and floorspace savings, helping to lower customer test costs dramatically. Advantest also offers the T5773ES, an engineering system for R&D use.

Key Specifications

Target Device
NAND flash memory (wafer test)
Parallel Test Capacity
6,144 DUT (1,536 DUT x 4 stages)
Max. Test Speed
Target Device
NAND flash memory, toggle-mode NAND flash memory, ONFI3 NAND flash memory, mask ROM, etc. (package test)
Parallel Test Capacity
768 DUT
Max. Test Speed
200MHz / 400Mbps (in DDR mode)


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