Agilent Technologies Introduces Universal Testing Machine for Nanomechanical Characterization at 2009 Materials Research Society Meeting
Agilent Technologies Inc. (NYSE: A) today introduced an easy-to-use, enhanced-performance universal testing machine (UTM) that offers highly accurate nanomechanical characterization capabilities. The Agilent T150 UTM lets researchers investigate dynamic properties of compliant fibers via the largest dynamic range and best resolution on the market -- five orders of magnitude of storage and loss modulus.
“The TI150 UTM is our most recent contribution to the advancement of nanomechanical test technology,” said Jeff Jones, operations manager for Agilent’s nanoinstrumentation facility in Chandler, Ariz. “It’s an ideal instrument for dynamic studies as well as characterizing yield of compliant fibers and biological materials, and tensile and compression studies of polymers. When used in conjunction with our Continuous Dynamic Analysis [CDA] option, the T150 enables the direct and accurate measurement of sample stiffness at each point throughout a given test, allowing mechanical properties to be determined continuously as the specimen is strained.”
The Agilent T150 UTM employs a nanomechanical actuating transducer head to produce tensile force (load on sample) using electromagnetic actuation combined with a precise capacitive gauge. This approach provides outstanding sensitivity across a large range of strain. The flexible, upgradeable T150 can be configured for repeatable specific applications or a variety of new applications. NanoSuite software offers real-time experimental control and easy test protocol development.
The Agilent T150 UTM provides fast, accurate generation of real-time test results; improved understanding of strain-rate-sensitive materials and time-dependent response; better statistical sampling in biomaterials applications; and automated reporting of test results in both Microsoft(r) Word and Excel. The user-friendly design of the T150 simplifies training requirements; standard tests can be run on the same day the instrument is installed.
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